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Spektroskopie

Spektrometrischer Nachweis von ultraleichten Elementen

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Literatur

[1] M. Terauchi, H. Takahachi, N. Handa, T. Murano, M. Koike, T. Kawachi, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, and S. Kuramotol, “A new WDS spectrometer for Valence Electron Spectroscopy based on Electron Microscopy,” JEOL News 47, 23 (2012)

[2] JEOL SS-94000 SXES, http://www.jeol.co.jp/news/detail/20140807.845.html

[3] J. Kern, J. Hattne, R. Tran, R Alonso-Mori, H. Laksmono, S. Gul, RG Sierra, J. Rehanek, A. Erko, R. Mitzner, Ph. Wernet, U. Bergmann, N. K. Sauter, V. Yachandra, J. Yano, “Methods development for diffraction and spectroscopy studies of metalloenzymes at X-ray free-electron lasers”, Philosophical Transactions of the Royal Society B: Biological Sciences (2014), 369, 1647, 20130590.

[4] A Erko, A Firsov, R Gubzhokov, A Bjeoumikhov, A Günther, N Langhoff, M. Bretschneider, Y. Höhn, R. Wedell, “New parallel wavelength-dispersive spectrometer based on scanning electron microscope” Optics Express (2014), 22 (14), 16897-16902

* A. Erko, A. Firsov, A. Hafner: Helmholtz-Zentrum Berlin (HZB), Institut für Nanometeroptik und Technologie (FG-INT), 12489 Berlin

* *R. Gubzhokov, A. Bjeoumikhov, A. Günther, M. Bretschneider: Institute for Scientific Instruments GmbH (IFG), 12489 Berlin

* **Norbert Langhoff, R. Wedell: Institut für angewandte Photonik e.V. (IAP Rudower Chaussee 29/3, 12489 Berlin

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